1 idt74fct162827at/ct fast cmos 20-bit buffer industrial temperature range may 2002 idt74fct162827at/ct industrial temperature range fast cmos 20-bit buffer description: the fct162827t 20-bit buffers are built using advanced dual metal cmos technology. these 20-bit bus drivers provide high-performance bus interface buffering for wide data/address paths or buses carrying parity. two pair of nand-ed output enable controls offer maximum control flexibility and are organized to operate the device as two 10-bit buffers or one 20-bit buffer. flow- through organization of signal pins simplifies layout. all inputs are designed with hysteresis for improved noise margin. the fct162827t has balanced output drive with current limiting resistors. this offers low ground bounce, minimal undershoot, and controlled output fall times?reducing the need for external series terminating resistors. the fct162827t is a plug-in replacement for the fct16827t and abt16827 for on-board interface applications. 2 y 1 to nine other chan- nels 2 oe 1 2 oe 2 2 a 1 1 y 1 to nine other chan- nels 1 oe 1 1 oe 2 1 a 1 1 56 55 28 29 42 2 15 features: ? 0.5 micron cmos technology ? high-speed, low-power cmos replacement for abt functions ? typical t sk(o) (output skew) < 250ps ? low input and output leakage 1a (max.) ? esd > 2000v per mil-std-883, method 3015; > 200v using machine model (c = 200pf, r = 0) ?v cc = 5v 10% ? balanced output drivers (24ma) ? reduced system switching noise ? typical v olp (output ground bounce) < 0.6v at v cc = 5v, t a = 25c ? available in ssop and tssop packages functional block diagram the idt logo is a registered trademark of integrated device technology, inc. ? 2002 integrated device technology, inc. dsc-5440/4
2 industrial temperature range idt74fct162827at/ct fast cmos 20-bit buffer ssop/ tssop top view pin configuration 1 y 1 gnd 1 y 3 v cc 1 oe 1 gnd 1 y 10 gnd 1 y 2 1 y 4 1 y 5 1 y 6 1 y 7 1 y 8 1 y 9 2 y 3 v cc gnd 2 y 4 2 y 5 2 y 7 2 y 8 2 y 6 2 oe 1 1 oe 2 1 a 1 1 a 2 gnd 1 a 3 1 a 4 v cc 1 a 5 1 a 6 1 a 7 1 a 8 1 a 9 1 a 10 gnd gnd 47 37 38 39 40 41 42 43 44 45 46 33 34 35 36 56 55 49 50 51 52 53 54 48 1 2 3 4 5 6 7 8 9 10 12 13 14 15 16 17 18 19 20 11 21 22 23 24 2 y 1 2 y 2 2 y 10 2 y 9 2 a 3 2 a 4 v cc 2 a 5 2 a 7 2 a 8 2 a 6 gnd 2 a 9 2 a 10 2 oe 2 29 30 31 32 25 26 27 28 2 a 1 2 a 2 symbol description max unit v term (2) terminal voltage with respect to gnd ?0.5 to 7 v v term (3) terminal voltage with respect to gnd ?0.5 to v cc +0.5 v t stg storage temperature ?65 to +150 c i out dc output current ?60 to +120 ma absolute maximum ratings (1) (1) (1) (1) (1) notes: 1. stresses greater than those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. all device terminals except fct162xxx output and i/o terminals. 3. outputs and i/o terminals for fct162xxx. symbol parameter (1) conditions typ. max. unit c in input capacitance v in = 0v 3.5 6 pf c out output capacitance v out = 0v 3.5 8 pf capacitance (t a = +25c, f = 1.0mhz) note: 1. this parameter is measured at characterization but not tested. pin names description x oe x output enable inputs (active low) x a x data inputs x y x 3-state outputs pin description inputs outputs x oe 1 x oe 2 xax xyx lll l llh h hxx z xh x z function table (1) note: 1. h = high voltage level l = low voltage level x = don?t care z = high-impedance
3 idt74fct162827at/ct fast cmos 20-bit buffer industrial temperature range symbol parameter test conditions (1) min. typ. (2) max. unit v ih input high level guaranteed logic high level 2 ? ? v v il input low level guaranteed logic low level ? ? 0.8 v i ih input high current (input pins) (4) v cc = max. v i = v cc ??1a input high current (i/o pins) (4) ??1 i il input low current (input pins) (4) v i = gnd ? ? 1 input low current (i/o pins) (4) ??1 i ozh high impedance output current v cc = max. v o = 2.7v ? ? 1 a i ozl (3-state output pins) (4) v o = 0.5v ? ? 1 v ik clamp diode voltage v cc = min., i in = ?18ma ? ?0.7 ?1.2 v i os short circuit current v cc = max., v o = gnd (3) ?80 ?140 ?250 ma v h input hysteresis ? ? 100 ? mv i ccl quiescent power supply current v cc = max ? 5 500 a i cch v in = gnd or v cc i ccz dc electrical characteristics over operating range following conditions apply unless otherwise specified: industrial: t a = ?40c to +85c, v cc = 5.0v 10% symbol parameter test conditions (1) min. typ. (2) max. unit i odl output low current v cc = 5v, v in = v ih or v il, v o = 1.5v (3) 60 115 200 ma i odh output high current v cc = 5v, v in = v ih or v il, v o = 1.5v (3) ?60 ?115 ?200 ma v oh output high voltage v cc = min. i oh = ?24ma 2.4 3.3 ? v v in = v ih or v il v ol output low voltage v cc = min. i ol = 24ma ? 0.3 0.55 v v in = v ih or v il notes: 1. for conditions shown as min. or max., use appropriate value specified under electrical characteristics for the applicable dev ice type. 2. typical values are at v cc = 5.0v, +25c ambient. 3. not more than one output should be shorted at one time. duration of the test should not exceed one second. 4. this test limit for this parameter is 5a at t a = ?55c. output drive characteristics
4 industrial temperature range idt74fct162827at/ct fast cmos 20-bit buffer symbol parameter test conditions (1) min. typ. (2) max. unit ? i cc quiescent power supply current v cc = max. ? 0.5 1.5 ma ttl inputs high v in = 3.4v (3) i ccd dynamic power supply current (4) v cc = max. v in = v cc ? 60 100 a/ outputs open v in = gnd mhz x oe 1 = x oe 2 = gnd one input toggling 50% duty cycle i c total power supply current (6) v cc = max. v in = v cc ? 0.6 1.5 ma outputs open v in = gnd fi = 10mhz 50% duty cycle v in = 3.4v ? 0.9 2.3 x oe 1 = x oe 2 = gnd v in = gnd one bit toggling v cc = max. v in = v cc ? 3 5.5 (5) outputs open v in = gnd fi = 2.5mhz 50% duty cycle v in = 3.4v ? 8 20.5 (5) x oe 1 = x oe 2 = gnd v in = gnd twenty bits toggling notes: 1. for conditions shown as min. or max., use appropriate value specified under electrical characteristics for the applicable dev ice type. 2. typical values are at v cc = 5.0v, +25c ambient. 3. per ttl driven input (v in = 3.4v). all other inputs at v cc or gnd. 4. this parameter is not directly testable, but is derived for use in total power supply calculations. 5. values for these conditions are examples of the i cc formula. these limits are guaranteed but not tested. 6. i c = i quiescent + i inputs + i dynamic i c = i cc + ? i cc d h n t + i ccd (f cp n cp /2 + fini) i cc = quiescent current (i ccl , i cch and i ccz ) ? i cc = power supply current for a ttl high input (v in = 3.4v) d h = duty cycle for ttl inputs high n t = number of ttl inputs at d h i ccd = dynamic current caused by an input transition pair (hlh or lhl) f cp = clock frequency for register devices (zero for non-register devices) n cp = number of clock inputs at f cp f i = input frequency n i = number of inputs at f i power supply characteristics
5 idt74fct162827at/ct fast cmos 20-bit buffer industrial temperature range fct162827at fct162827ct symbol parameter condition (1) min. (2) max. min. (2) max. unit t plh propagation delay c l = 50pf 1.5 8 1.5 3.7 ns t phl xax to xyx r l = 500 ? c l = 300pf (4) 1.5 15 1.5 7 r l = 500 ? t pzh output enable time c l = 50pf 1.5 12 .5 4.8 ns t pzl x oe x to xyx r l = 500 ? c l = 300pf (4) 1.5 23 1.5 9 r l = 500 ? t phz output disable time c l = 5pf (4) 1.5 9 1.5 4 ns t plz x oe x to xyx r l = 500 ? c l = 50pf 1.5 10 1.5 4 r l = 500 ? t sk(o) output skew (3) ? 0.5 ? 0.5 ns switching characteristics over operating range notes: 1. see test circuit and waveforms. 2. minimum limits are guaranteed but not tested on propagation delays. 3. skew between any two outputs, of the same package, switching in the same direction. this parameter is guaranteed by design. 4. this limit is guaranteed but not tested.
6 industrial temperature range idt74fct162827at/ct fast cmos 20-bit buffer pulse generator r t d.u.t. v cc v in c l v out 50pf 500 ? 500 ? 7.0v 3v 1.5v 0v 3v 1.5v 0v 3v 1.5v 0v 3v 1.5v 0v data input timing input asynchronous control preset clear etc. synchronous control t su t h t rem t su t h preset clear clock enable etc. high-low-high pulse low-high-low pulse t w 1.5v 1.5v same phase input transition 3v 1.5v 0v 1.5v v oh t plh output opposite phase input transition 3v 1.5v 0v t plh t phl t phl v ol control input 3v 1.5v 0v 3.5v 0v output normally low output normally high switch closed switch open v ol 0.3v 0.3v t plz t pzl t pzh t phz 3.5v 0v 1.5v 1.5v enable disable v oh test circuits and waveforms propagation delay test circuits for all outputs enable and disable times set-up, hold, and release times pulse width notes: 1. diagram shown for input control enable-low and input control disable-high. 2. pulse generator for all pulses: rate 1.0mhz; t f 2.5ns; t r 2.5ns. test switch open drain disable low closed enable low all other tests open switch position definitions: c l = load capacitance: includes jig and probe capacitance. r t = termination resistance: should be equal to z out of the pulse generator.
7 idt74fct162827at/ct fast cmos 20-bit buffer industrial temperature range ordering information idt xx temp. range xxxx device type xx package pv pa pag shrink small outline package thin shrink small outline package tssop - green 20-bit buffer 74 ? 40 c to +85 c 162 double-density, 5 volt, balanced drive fct xxx family 827at 827ct data sheet document history 1/21/2002 removed military temp grade 4/9/2002 removed b speed option 5/21/2002 removed tvsop package 7/19/2004 added green package corporate headquarters for sales: for tech support: 2975 stender way 800-345-7015 or 408-727-6116 logichelp@idt.com santa clara, ca 95054 fax: 408-492-8674 (408) 654-6459 www.idt.com
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